Impact of Hot Carrier Aging on the Performance of...

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IEEE Transactions on Electron Devices 2020

Impact of Hot Carrier Aging on the Performance of Triple-Gate Junctionless MOSFETs

Oproglidis, Theodoros A., Karatsori, Theano A., Theodorou, Christoforos G., Tsormpatzoglou, Andreas, Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2958457
File:
PDF, 1.37 MB
english, 2020
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