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Improving the analytical sensitivity of alpha-emitting impurities in grinding high purity silica
Kil Yong Lee, Yoon Yeol Yoon, Soo Young Cho, Yongje KimVolume:
276
Language:
english
Pages:
6
DOI:
10.1007/s10967-007-0418-4
Date:
April, 2008
File:
PDF, 198 KB
english, 2008