Effect of SDBS on the oxidation reliability of...

Effect of SDBS on the oxidation reliability of screen-printed Cu circuits

Lee, Choong-Jae, Kim, Jae-Ha, Hwang, Byeong-Uk, Min, Kyung Deuk, Jung, Seung-Boo
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Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-02847-z
Date:
January, 2020
File:
PDF, 1.89 MB
english, 2020
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