Measurement and energy correction due to charge carrier...

Measurement and energy correction due to charge carrier lifetimes in large HPGe spectrometers

Jeremy D. Kephart, C. E. Aalseth, H. S. Miley
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Volume:
282
Language:
english
Pages:
4
DOI:
10.1007/s10967-009-0216-2
Date:
December, 2009
File:
PDF, 196 KB
english, 2009
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