![](/img/cover-not-exists.png)
Measurement and energy correction due to charge carrier lifetimes in large HPGe spectrometers
Jeremy D. Kephart, C. E. Aalseth, H. S. MileyVolume:
282
Language:
english
Pages:
4
DOI:
10.1007/s10967-009-0216-2
Date:
December, 2009
File:
PDF, 196 KB
english, 2009