Effect of the interface morphology on the lateral electron...

Journal of Applied Physics 2019 / 12 Vol. 126; Iss. 21

Effect of the interface morphology on the lateral electron transport in (001) GaP/Si heterostructures

Ostheim, L., Klar, P. J., Moryson, Y., Rohnke, M., Beyer, A., Volk, M., Munde, M., Stolz, W., Volz, K.
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Volume:
126
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5124049
Date:
December, 2019
File:
PDF, 2.65 MB
english, 2019
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