An analysis of defects induced by high dose γ-ray irradiation and their influence on the charge transport properties in CdZnTe detectors
Guo, Rongrong, Xu, Yadong, Wang, Tao, Zha, Gangqiang, Jie, WanqiVolume:
127
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5126792
Date:
January, 2020
File:
PDF, 1.51 MB
english, 2020