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[IEEE 2019 IEEE International Test Conference in Asia (ITC-Asia) - Tokyo, Japan (2019.9.3-2019.9.5)] 2019 IEEE International Test Conference in Asia (ITC-Asia) - Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing
Shibasaki, Yukiko, Asami, Koji, Kuwana, Anna, Machida, Kosuke, Du, Yuanyang, Hatta, Akemi, Kubo, Kazuyoshi, Kobayashi, HaruoYear:
2019
Language:
english
DOI:
10.1109/itc-asia.2019.00015
File:
PDF, 963 KB
english, 2019