![](/img/cover-not-exists.png)
Determination of total As in onion plants growing in contaminated substrates by total reflection X-ray fluorescence
Lué-Merú Marcó ParraVolume:
287
Language:
english
Pages:
6
DOI:
10.1007/s10967-010-0834-8
Date:
February, 2011
File:
PDF, 202 KB
english, 2011