Optimization of Small-Delay Defects Test Quality by Clock...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2020

Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage

Hasib, Omar Al-Terkawi, Savaria, Yvon, Thibeault, Claude
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2019.2949037
File:
PDF, 2.97 MB
english, 2020
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