Detection of mechanical effects of adhesive thin films on substrate using the modulated-temperature dilatometry (MT DIL)
P. Myśliński, P. Kamasa, A. Gilewicz, J. StaśkiewiczVolume:
88
Language:
english
Pages:
4
DOI:
10.1007/s10973-006-8073-5
Date:
June, 2007
File:
PDF, 170 KB
english, 2007