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Design of High-Voltage-Tolerant Power-Rail ESD Protection Circuit for Power Pin of Negative Voltage in Low-Voltage CMOS Processes
Chang, Rong-Kun, Ker, Ming-DouVolume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2954754
Date:
January, 2020
File:
PDF, 3.51 MB
2020