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Total Ionizing Dose Effects in 30V Split-Gate Trench VDMOS
Wang, Ruidi, Li, Zhixuan, Qiao, Ming, Zhou, Xin, Wang, Tianqi, Zhang, BoYear:
2020
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2020.2965286
File:
PDF, 759 KB
2020