![](/img/cover-not-exists.png)
A review of demodulation techniques for multifrequency atomic force microscopy
Harcombe, David M, Ruppert, Michael G, Fleming, Andrew JVolume:
11
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.11.8
Date:
January, 2020
File:
PDF, 6.34 MB
2020