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Light-induced capacitance enhancement and successive carrier escape in InGaN/GaN multiple quantum wells
Yoo, Jengsu, Nam, Yoonsung, Kim, Tae-Soo, Jung, Gunwoo, Song, Jung-Hoon, Chang, Soo-KyungVolume:
127
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5108915
Date:
January, 2020
File:
PDF, 1.61 MB
2020