Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility
Wimmer, C., Bonomo, F., Hurlbatt, A., Schiesko, L., Fantz, U., Harder, N. den, Heinemann, B., Mimo, A., Orozco, G., Agostini, M., Barbisan, M., Brombin, M., Delogu, R., Pimazzoni, A., Poggi, C., SeriaVolume:
91
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5129336
Date:
January, 2020
File:
PDF, 2.19 MB
2020