Feature Extraction for 3D Palmprint Recognition: A Survey
Fei, Lunke, Zhang, Bob, Jia, Wei, Wen, Jie, Zhang, DavidYear:
2020
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2020.2964076
File:
PDF, 3.07 MB
2020