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A Method for the Localization of an Elongated Subsurface Defect in a Conducting Material
Ya. P. Kulynych, I. I. TryhubVolume:
40
Language:
english
Pages:
6
DOI:
10.1007/s11003-005-0096-8
Date:
September, 2004
File:
PDF, 743 KB
english, 2004