A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register (MISR)
Ahmad, AfaqVolume:
1
Language:
english
Journal:
International Journal of VLSI Design & Communication Systems
DOI:
10.5121/vlsic.2010.1401
Date:
December, 2010
File:
PDF, 360 KB
english, 2010