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[AIP Accelerator instrumentation - Batavia, Illinois (USA) (1−4 Oct 1990)] AIP Conference Proceedings - Tuned-antenna driver for microstrip probe sensitivity testing
Shurter, R. B., Gilpatrick, J. D.Volume:
229
Year:
1991
Language:
english
DOI:
10.1063/1.40738
File:
PDF, 431 KB
english, 1991