[IEEE 2019 IEEE International Workshop on Metrology for...

  • Main
  • [IEEE 2019 IEEE International Workshop...

[IEEE 2019 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor) - Portici, Italy (2019.10.24-2019.10.26)] 2019 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor) - LEAF: a process-based model of berry ripening in vineyards

Carteni, Fabrizio, Rossi, Claudio, Marcos, Raul, Porras, Ignasi, Basile, Boris, Scognamiglio, Pasquale, Teobaldelli, Maurizio, Mataffo, Alessandro, Mazzoleni, Stefano, Garcia-Tejera, Omar, Girona, Joa
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/MetroAgriFor.2019.8909224
File:
PDF, 335 KB
english, 2019
Conversion to is in progress
Conversion to is failed