Failure Mechanism of Avalanche Condition for 1200V Double...

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IEEE Journal of Emerging and Selected Topics in Power Electronics 2020

Failure Mechanism of Avalanche Condition for 1200V Double Trench SiC MOSFET

Li, Xuan, Zhang, Bo, Tong, Xing, Hu, Rui, Wen, Yi, Zhu, Hao, Deng, Xiaochuan, Sun, Yongkui, Chen, Wanjun, Bai, Song
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Year:
2020
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2020.2965002
File:
PDF, 1.56 MB
english, 2020
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