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[IEEE 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Sydney, Australia (2018.11.10-2018.11.17)] 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) - A new model for the TCAD simulation of the silicon damage by high fluence proton irradiation
Schwandt, Joern, Fretwurst, Eckhart, Garutti, Erika, Klanner, Robert, Scharf, Christian, Steinbrueck, GeorgYear:
2018
Language:
english
DOI:
10.1109/nssmic.2018.8824412
File:
PDF, 954 KB
english, 2018