Characterization of a Yield Quantitative Trait Locus on...

Characterization of a Yield Quantitative Trait Locus on Chromosome Five of Maize by Fine Mapping

Graham, Geoffrey I., Wolff, David W., Stuber, Charles W.
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Volume:
37
Language:
english
Journal:
Crop Science
DOI:
10.2135/cropsci1997.0011183X003700050033x
Date:
September, 1997
File:
PDF, 260 KB
english, 1997
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