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Degradation of Pt-Al 2 O 3 -Ge Metal Oxide Semiconductor Structures due to Pt-Al 2 O 3 Induced Reactions
Ioannou-Sougleridis, Vassilios, Alafakis, Stamatios, Vouroutzis, Nikolaos Z., Mergia, Konstantina, Speliotis, Athanassios, Skarlatos, DimitriosVolume:
9
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2162-8777/ab682e
Date:
January, 2020
File:
PDF, 1.89 MB
english, 2020