Imaging of microdefects in ZnGeP2 single crystals by X-ray...

Journal of Crystal Growth 2020 / 03 Vol. 534

Imaging of microdefects in ZnGeP2 single crystals by X-ray topography

Lei, Zuotao, Okunev, Alexei, Zhu, Chongqiang, Verozubova, Galina, Yang, Chunghui
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Volume:
534
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2020.125487
Date:
March, 2020
File:
PDF, 2.26 MB
english, 2020
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