Noise spectroscopy as a method of monitoring the quality of developed semiconductor devices
I. N. Miroshnikova, V. P. Astakhov, E. V. Zenova, A. M. Tagachenkov, D. A. RachnikovVolume:
54
Language:
english
Pages:
4
DOI:
10.1007/s11018-011-9792-y
Date:
September, 2011
File:
PDF, 201 KB
english, 2011