Verification of Single-Pulse Avalanche Failure Mechanism for Double-Trench SiC Power MOSFETs
Wei, Jiaxing, Liu, Siyang, Zhao, Hangbo, Fu, Hao, Zhang, Xiaobing, Li, Shiyan, Sun, WeifengYear:
2020
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/jestpe.2020.2967679
File:
PDF, 1.73 MB
english, 2020