Accuracy improvement of phase estimation in electron...

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Microscopy 2020 / 01

Accuracy improvement of phase estimation in electron holography using noise reduction methods

Midoh, Yoshihiro, Nakamae, Koji
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Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfz115
Date:
January, 2020
File:
PDF, 2.03 MB
english, 2020
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