[IEEE 2019 International Semiconductor Conference (CAS) - Sinaia, Romania (2019.10.9-2019.10.11)] 2019 International Semiconductor Conference (CAS) - Experimental and Theoretical Validation of Ga 2 O 3 Thin Films Deposited by Physical Vapor Deposition
Lai, Khue T., Badiei, Nafiseh, Deng, Shuo, Igic, Petar, Li, LijieYear:
2019
Language:
english
DOI:
10.1109/SMICND.2019.8923753
File:
PDF, 310 KB
english, 2019