Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning
Chen, Zhen, Xia, Tangbin, Li, Yanting, Pan, ErshunYear:
2019
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2019.2955596
File:
PDF, 4.95 MB
english, 2019