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Calculated Patterns in X-Ray Powder Diffraction Analysis
McCarthy, Gregory J., Martin, Kyli J., Holzer, Jean M., Grier, Dean G., Syvinski, Wayne M., Nodland, Darred W.Volume:
35
Year:
1991
Language:
english
Journal:
Advances in X-ray Analysis
DOI:
10.1154/S0376030800008624
File:
PDF, 292 KB
english, 1991