Benchmarking β‐Ga 2 O...

Advanced Electronic Materials 2020 / 01

Benchmarking β‐Ga 2 O 3 Schottky Diodes by Nanoscale Ballistic Electron Emission Microscopy

Buzio, Renato, Gerbi, Andrea, He, Qiming, Qin, Yuan, Mu, Wenxiang, Jia, Zhitai, Tao, Xutang, Xu, Guangwei, Long, Shibing
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Language:
english
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201901151
Date:
January, 2020
File:
PDF, 2.38 MB
english, 2020
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