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[IEEE 2019 IEEE 28th Asian Test Symposium (ATS) - Kolkata, India (2019.12.10-2019.12.13)] 2019 IEEE 28th Asian Test Symposium (ATS) - Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test
Mondal, Manobendra Nath, Chowdhury, Animesh Basak, Pradhan, Manjari, Sur-Kolay, Susmita, Bhattacharya, Bhargab B.Year:
2019
DOI:
10.1109/ATS47505.2019.000-5
File:
PDF, 525 KB
2019