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[IEEE 2019 International Conference on Technologies and Applications of Artiï¬cial Intelligence (TAAI) - Kaohsiung, Taiwan (2019.11.21-2019.11.23)] 2019 International Conference on Technologies and Applications of Artiï¬cial Intelligence (TAAI) - Ball-Grid-Array Chip Defects Detection and Classification Using Patch-based Modified YOLOv3
Le, Phong-Phu, Guo, Shu-Mei, Chen, Ju-Chin, Lien, Jenn-Jier JamesYear:
2019
DOI:
10.1109/taai48200.2019.8959827
File:
PDF, 347 KB
2019