Behavior Study of the Nanostructured Zn1-xCdxO...

Silicon 2020 / 1

Behavior Study of the Nanostructured Zn1-xCdxO (0 ≤ x ≤ 0.1) Semiconductor Thin Films Deposited onto Silicon Substrate by Dip-Coating Method

Rahal, Badis, Boudine, Boubekeur, Souami, Nassim, Siad, Menouar, Sebais, Miloud, Halimi, Ouahiba, Guerbous, Lakhdar
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Language:
english
Journal:
Silicon
DOI:
10.1007/s12633-020-00388-3
Date:
January, 2020
File:
PDF, 1.73 MB
english, 2020
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