A Novel Dice Similarity Measure for IFSs and its...

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A Novel Dice Similarity Measure for IFSs and its Applications in Pattern and Face Recognition

Singh, Akanksha, Kumar, Sanjay
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Language:
english
Journal:
Expert Systems with Applications
DOI:
10.1016/j.eswa.2020.113245
Date:
January, 2020
File:
PDF, 7.58 MB
english, 2020
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