Focused Electron Beam-Based 3D Nanoprinting for Scanning...

Micromachines 2019 / 12 Vol. 11; Iss. 1

Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review

Plank, Harald, Winkler, Robert, Schwalb, Christian H., Hütner, Johanna, Fowlkes, Jason D., Rack, Philip D., Utke, Ivo, Huth, Michael
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Volume:
11
Journal:
Micromachines
DOI:
10.3390/mi11010048
Date:
December, 2019
File:
PDF, 8.32 MB
2019
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