Influence of Thickness and Sputtering Pressure on...

Influence of Thickness and Sputtering Pressure on Electrical Resistivity and Elastic Wave Propagation in Oriented Columnar Tungsten Thin Films

Chargui, Asma, El Beainou, Raya, Mosset, Alexis, Euphrasie, Sébastien, Potin, Valérie, Vairac, Pascal, Martin, Nicolas
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Volume:
10
Journal:
Nanomaterials
DOI:
10.3390/nano10010081
Date:
January, 2020
File:
PDF, 7.66 MB
2020
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