Electro-Thermal Model for Thermal Disturbance in...

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IEEE Transactions on Electron Devices 2020

Electro-Thermal Model for Thermal Disturbance in Cross-Point Phase-Change Memory

Yoo, Sijung, Lee, Hyung Dong, Lee, Seungyun, Choi, Hyejung, Kim, Taehoon
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2960444
File:
PDF, 981 KB
english, 2020
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