Effects of Interface Traps and Self-Heating on the...

  • Main
  • 2020
  • Effects of Interface Traps and Self-Heating on the...
IEEE Transactions on Electron Devices 2020

Effects of Interface Traps and Self-Heating on the Performance of GAA GaN Vertical Nanowire MOSFET

Thingujam, Terirama, Son, Dong-Hyeok, Kim, Jeong-Gil, Cristoloveanu, Sorin, Lee, Jung-Hee
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2963427
File:
PDF, 1.98 MB
english, 2020
Conversion to is in progress
Conversion to is failed