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Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs
Park, Jun-Young, Moon, Dong-Il, Lee, Geon-Beom, Choi, Yang-KyuYear:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2964846
File:
PDF, 1.16 MB
english, 2020