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Inflection Phenomenon in Cryogenic MOSFET Behavior
Beckers, Arnout, Jazaeri, Farzan, Enz, ChristianYear:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2965475
File:
PDF, 7.68 MB
english, 2020