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Analysis of Discharge Faults Between Flanges Caused by Transient Enclosure Voltage
Li, Jisheng, He, Zeyu, Wang, Yu, Chen, Xiaoyue, Liu, YongcongVolume:
8
Year:
2020
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.2965197
File:
PDF, 4.40 MB
english, 2020