[IEEE 2019 IEEE International Instrumentation and...

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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Excitation Patterns in 3D Electrical Impedance Tomography for Breast Imaging

Sun, Shijie, Xu, Lijun, Cao, Zhang, Sun, Jiangtao, Tian, Wenbin, Li, Duan
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Year:
2019
Language:
english
DOI:
10.1109/i2mtc.2019.8826844
File:
PDF, 188 KB
english, 2019
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