Reliability of Atmosphere Pressure-Plasma Enhanced Chemical...

Reliability of Atmosphere Pressure-Plasma Enhanced Chemical Vapor Deposition Deposited Indium Gallium Zinc Oxide Resistive Random Access Memory Device with Microwave Annealing

Wu, Chien-Hung, Kuo, Song-Nian, Chang, Kow-Ming, Chen, Yi-Ming, Zhang, Yu-Xin, Xu, Ni, Liu, Wu-Yang, Chin, Albert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2020.17560
Date:
July, 2020
File:
PDF, 3.21 MB
english, 2020
Conversion to is in progress
Conversion to is failed