[IEEE 2019 Design, Automation & Test in Europe...

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[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Low-Power Variation-Aware Cores based on Dynamic Data-Dependent Bitwidth Truncation

Tsiokanos, Ioannis, Mukhanov, Lev, Karakonstantis, Georgios
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Year:
2019
Language:
english
DOI:
10.23919/DATE.2019.8714942
File:
PDF, 403 KB
english, 2019
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