Quantifying the Extent of Ligand Incorporation and the...

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Quantifying the Extent of Ligand Incorporation and the Effect on Properties of TiO 2 Thin Films Grown by Atomic Layer Deposition Using an Alkoxide or an Alkylamide

Dufond, Maxime E., Diouf, Maïmouna W., Badie, Clémence, Laffon, Carine, Parent, Philippe, Ferry, Daniel, Grosso, David, Kools, Jacques C S, Elliott, Simon D., Santinacci, Lionel
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Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/acs.chemmater.9b03621
Date:
January, 2020
File:
PDF, 19.02 MB
english, 2020
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