An assessment on crystallization phenomena of Si in Al/a-Si...

RSC Advances 2020 Vol. 10; Iss. 8

An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation

Maity, G., Dubey, S., El-Azab, Anter, Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., Patel, Shiv P.
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Volume:
10
Year:
2020
Language:
english
Journal:
RSC Advances
DOI:
10.1039/C9RA08836A
File:
PDF, 3.00 MB
english, 2020
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