NHPP Testability Growth Model Considering Testability...

IEEE Access 2020 Vol. 8

NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction

Li, Tianmei, Si, Xiaosheng, Yang, Zonghao, Pei, Hong, Ma, Yuzhe
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Volume:
8
Year:
2020
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2019.2962528
File:
PDF, 6.76 MB
english, 2020
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