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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2019

Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation

Weller, Dennis D., Hefenbrock, Michael, Golanbari, Mohammad S., Beigl, Michael, Aghassi-Hagmann, Jasmin, Tahoori, Mehdi B.
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2019.2961321
File:
PDF, 3.26 MB
english, 2019
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